published 18.09.25

Senior Process Engineer

Location

Plymouth

Basis

Full Time

The Thin Film Ellipsometry Process Engineer is responsible for developing, optimising, and controlling thin-film optical measurement and characterisation processes to support high-yield, high-performance semiconductor device fabrication. This role focuses on ellipsometry-based metrology for deposited thin films across development and production environments.

Key Responsibilities
  • Develop, qualify, and optimise ellipsometry measurement processes for thin films (thickness, refractive index n/k, composition, and uniformity).
  • Support R&D and new materials development by providing accurate thin-film characterisation, measurement development, and data analysis.
  • Own and maintain ellipsometry process recipes, optical models, and control strategies.
  • Provide accurate metrology feedback to thin-film deposition processes (e.g., PVD, CVD, ALD).
  • Analyse film properties including thickness mapping, optical constants, and process-induced variation.
  • Develop and refine optical models for multilayer thin-film stacks.
  • Utilise statistical process control (SPC) to monitor tool performance and process stability.
  •  Conduct root cause analysis for measurement drift, model instability, or yield excursions related to film properties.
  • Collaborate with equipment and process engineering teams to maintain and improve metrology tool performance.
  • Support new product introduction (NPI) through film characterisation, DOE planning, and process transfer.
  • Generate technical reports and present findings to engineering and management teams.
  •  Ensure compliance with safety and cleanroom protocols.

Skills, Knowledge and Expertise
  • Bachelor’s or Master’s degree in Materials Science, Physics, Electrical Engineering, or related field.
  •  3–7+ years of experience in semiconductor or advanced thin-film processing environments.
  • Strong hands-on experience with spectroscopic ellipsometry.
  • Solid understanding of thin-film optics, dispersion modelling, and multilayer analysis.
  • Experience correlating ellipsometry data with complementary techniques (e.g., XRD, AFM, profilometry).
  • Strong data analysis and problem-solving skills.
  • Strong ownership mentality with the ability to work independently in a fast-paced environment.
  • Adaptable and comfortable with evolving priorities and rapid change.
  • Excellent cross-functional collaboration skills (working effectively with process, equipment, R&D, and manufacturing teams).
  • Clear and confident communicator, able to present technical findings to both technical and non-technical audiences.
  • Experience with compound semiconductor or dielectric thin films would be an advantage. 


Perks & Benefits
  • Pension scheme 
  • Private medical & dental insurance 
  • 28 days’ holiday + bank holidays 
  • Free onsite meals 
  • Onsite gym 
  • Relocation support 
  • Visa support available


Apply now